1.

国際会議録
国際会議録
1. Influence of the annealing duration on the interface roughness and electrical properties of low-dose SIMOX wafers
Munteanu, D. ; Guilhalmenc, C. ; Cristoloveanu, S. ; Moriceau, H. ; Cartier, A.M. ; Aspar, B.
出版情報: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.131-136,  1997.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 97-23
2.

国際会議録
国際会議録
2. Influence of Nitrogen or Argon Anneals on the Properties of SIMOX Wafers and Devices
Cristoloveanu, S. ; Ionescu, A. ; Wetteroth, T. ; Shin, H. ; Munteanu, D. ; Gentil, P. ; Hong, S. ; Wilson, S. R.
出版情報: Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A..  pp.213-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 446