1.

国際会議録
国際会議録
1. OPTICAL DETECTION OF MAGNETIC RESONANCE (ODMR) STUDIES OF THE ELECTRONIC STRUCTURE OF COMPLEX DEFECTS IN GaP
Chen, W. M. ; Godlewski, M. ; Monemar, B. ; Gislason, H. P.
出版情報: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.443-448,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 104
2.

国際会議録
国際会議録
2. OPTICALLY DETECTED MAGNETIC RESONANCE STUDIES OF COMPLEX ANTISITE-RELATED DEFECTS IN BULK LEC GaP
Chen, W. M. ; Godlewski, M. ; Monemar, B. ; Gislason, H. P.
出版情報: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.467-470,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 104
3.

国際会議録
国際会議録
3. SPECTROSCOPY OF IMPURITIES AND COMPLEX DEFECTS IN SILICON IN ELECTRIC AND MICROWAVE FIELDS
Godlewski, M. ; Weman, H. ; Wang, F. P. ; Monemar, B. ; Chen, W. M. ; Zhao, Q. X.
出版情報: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.117-120,  1988.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 104