1.

国際会議録
国際会議録
1. Study of Deep Levels by Admittance Spectroscopy in High Resistivity P-Type 6H-SiC Single Crystals
Evwaraye, A. O. ; Smith, S. R. ; Mitchel, W. C.
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.539-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378
2.

国際会議録
国際会議録
2. Temperature Dependence of Metal-Semiconductor Contacts on 6H-SiC
Smith, S. R. ; Evwaraye, A. O. ; Mitchel, W. C.
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.835-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378