1.

国際会議録
国際会議録
1. Magneto-optical characterisation of CuIn(Ga)Se2
Meyer,B.K. ; Wagner,Mt. ; Dirnstorfer,I. ; Hofmann,D.M. ; Karg,F.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1467-1472,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
2.

国際会議録
国際会議録
2. X-Band ENDOR of Boron and Beryllium Acceptors in Silicon Carbide
Hofstaetter,A. ; Meyer,B.K. ; Scharmann,A. ; Baranov,P.G. ; Ilyin,I.V. ; Mokhov,E.N.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.595-598,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
3.

国際会議録
国際会議録
3. Zeeman Spectroscopy on the Nitrogen Acceptor-Bound Exeiton in Epitaxiai ZnSe
Stadler,W. ; Meyer,B.K. ; Volm,D. ; Hofmam,D.M. ; Hoffmann,A. ; Wiesmann,D. ; Heitz,R. ; Kurtz,E. ; Hommel,D.
出版情報: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.303-306,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 182-184
4.

国際会議録
国際会議録
4. Optically Detected Cyclotron Resonance Investigation of Epitaxiaily Grown ZnSe
Volm,D. ; Stadler,W. ; Meyer,B.K. ; Traudt,W. ; Sollner,J. ; Heuken,M. ; Wolf,K. ; Reisinger,T. ; Kurtz,L. ; Hommel,D. ; Hofmann,D.M.
出版情報: II-VI compounds and semimagnetic semiconductors : joint proceedings of the Third European Workshop on II-VI Compounds, Linz, Austria, 26-28 September 1994, and the Fourth International Workshop on Semimagnetic (Diluted Magnetic) Semiconductors, Linz, Austria, 26-28 September 1994.  pp.307-310,  1995.  Aedermannsdorf, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 182-184
5.

国際会議録
国際会議録
5. Residual Donors in GaN Epitaxial Films-A Correlation of HALL Effect,SIMS and Photoluminescence Data
Topf,M. ; Kriegseis,W. ; Burkhardt,W. ; Dirnstorfer,I. ; Meister,D. ; Meyer,B.K.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1323-1326,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
6.

国際会議録
国際会議録
6. Zeeman Spectroscopy of Transition Metals in Hexagonal GaN
Heitz,R. ; Thurian,P. ; Loa,I. ; Eckey,L. ; Hoffmann,A. ; Broser,I. ; Pressel,K. ; Meyer,B.K. ; Mokhov,E.N.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.719-724,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
7.

国際会議録
国際会議録
7. On the Identification of an Al Related Deep Centre in 4H-SiC-Self-Compensation in SiC?
Meyer,B.K. ; Hofstaetter,A. ; Baranov,P.G.
出版情報: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part1  pp.591-594,  1998.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 264-268
8.

国際会議録
国際会議録
8. Local Vibrational Modes of 3d Elements in Wurtzite Type ZnO and GaN Crystals
Thurian,P. ; Kaczmarczyk,G. ; Siegle,H. ; Heitz,R. ; Hoffmann,A. ; Broser,I. ; Meyer,B.K. ; Hoffbauer,R. ; Scherz,U.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1571-1576,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201
9.

国際会議録
国際会議録
9. Electron Nuclear Double Resonance Investigations on the Tellurium Vacancy in CdTe
Hofmann,D.M. ; Meyer,B.K. ; Pawlik,T. ; Alteheld,P. ; Spaeth,J.-M.
出版情報: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.417-422,  1994.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 143-147
10.

国際会議録
国際会議録
10. Defects in Porous Silicon:A Study with Optical and Spin Resonance Methods
Hofmann,D.M. ; Meyer,B.K. ; Christmann,P. ; Wimbauer,T. ; Stadler,W. ; Nikolov,A. ; Scharmann,A. ; Hofstatter,A.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1673-1678,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201