1.

国際会議録
国際会議録
1. *CRYSTALLOGRAPHIC AND METALLURGICAL CHARACTERIZATION OF RADIATION DETECTOR GRADE CADMIUM TELLURIDE MATERIALS
Johnson, C.J. ; Eissler, E.E. ; Cameron, S.E. ; Kong, Y. ; Fan, S. ; Jovanovic, S. ; Lynn, K.G.
出版情報: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.215-230,  1994.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 299
2.

国際会議録
国際会議録
2. Detection of Corrosion - Related Defects in Aluminum Using Positron Annihilation Spectroscopy
Wu, X. ; Asoka-Kumar, P. ; Lynn, K.G.
出版情報: Proceedings of the Seventh International Symposium on Oxide Films on Metals and Alloys.  pp.106-118,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-25
3.

国際会議録
国際会議録
3. Visible-Light Emission From Silicon-Implanted and Annealed SiO2 Layers
Ghislotti, G. ; Nielsen, B. ; Asoka-Kumar, P. ; Lynn, K.G. ; di Mauro, L.F. ; Bottani, C.E. ; Corni, F. ; Tonini, R. ; Ottaviani, G.
出版情報: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.468-476,  1996.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 96-1