1.

国際会議録
国際会議録
1. Combined polarizing interferometer and optical beam deflection system for MEMS characterization
Jenkins,D.F.L. ; Clegg,W.W. ; Liu,X. ; Tunstall,G. ; Cattan,E. ; Remiens,D. ; Liu,B.
出版情報: Novel optical systems design and optimization IV : 1-2 August , 2001, San Diego, USA.  pp.15-25,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4442
2.

国際会議録
国際会議録
2. 3D navigation for endoscope by magnetic field
Liu,X. ; Chen,X. ; Lin,D. ; Zhang,Q. ; Tamura,S.
出版情報: Data mining and applications : 23-24 October 2001, Wuhan, China.  pp.25-28,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4556
3.

国際会議録
国際会議録
3. Rapid fabrication of embossing tools for the production of polymeric microfluidic devices for bioanalytical applications
Ford,S.M. ; McCandless,A.B. ; Liu,X. ; Soper,S.A.
出版情報: Microfluidics and bioMEMS : 22-24 October 2001, San Francisco, USA.  pp.207-216,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4560
4.

国際会議録
国際会議録
4. MEMS technologies for rf communications
Wu,Q. ; Liu,X. ; Kim,B.
出版情報: MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK.  pp.267-274,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4407
5.

国際会議録
国際会議録
5. QE reduction due to pixel vignetting in CMOS image sensors
Catrysse,P.B. ; Liu,X. ; Gamal,A.El
出版情報: Sensors and camera systems for scientific, industrial, and digital photography applications : 24-26 January 2000, San Jose, USA.  pp.420-430,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3965
6.

国際会議録
国際会議録
6. Apply semantic template to support content-based image retrieval
Zhuang,Y. ; Liu,X. ; Pan,Y.
出版情報: Storage and retrieval for media databases 2000 : 26-28 January 2000, San Jose, California.  pp.442-449,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3972
7.

国際会議録
国際会議録
7. SERS spectra of TvNPV-VP influenced by the pH value of Ag hydrosols
Bao,P. ; Huang,T. ; Liu,X. ; Wu,G.
出版情報: Biomedical spectroscopy : vibrational spectroscopy and other novel techniques : 26-27 January 2000, San Jose, California.  pp.235-240,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3918
8.

国際会議録
国際会議録
8. Geometry of GLP on silver surface by surface-enhanced Raman spectroscopy
Bao,P. ; Bao,L. ; Huang,T. ; Liu,X. ; Wu,G.
出版情報: Biomedical spectroscopy : vibrational spectroscopy and other novel techniques : 26-27 January 2000, San Jose, California.  pp.210-214,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3918
9.

国際会議録
国際会議録
9. Image-based recognition of the chip shape
Liu,X. ; Zhao,G. ; Lin,L. ; Meng,A.
出版情報: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.230-233,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4221
10.

国際会議録
国際会議録
10. Autofocus methods for automated miccroscopy
Wu,X. ; Liu,X. ; Zhou,Y. ; Tao,D. ; He,X. ; Teng,Q.
出版情報: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.114-117,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4224