1.

国際会議録
国際会議録
1. Calculation of extended bidirectional reflectance distribution function for subsurface defect scattering [6150-184]
Shen, J. ; Liu, S ; Kong, W ; Shen, Z ; Shao, J ; Fan, Z
出版情報: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.615035-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 6150
2.

国際会議録
国際会議録
2. Theoretical analysis and fabrication technique of micro holographic Fresnel lens
Liu, S ; Zhang, X ; Liu, C
出版情報: Practical Holography XVI and Holographic Materials VIII.  pp.277-283,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4659