Design, modeling, and simulation in microelectronics : 28-30 November 2000, Singapore. pp.309-314, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Microelectronic Yield, Reliability, and Advanced Packaging. pp.116-122, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering