1.

国際会議録
国際会議録
1. Dependency of electric field and mechanical stress on piezoelectric strain of PZT 3203HD
Jang, S.H. ; Kim, Y.S. ; Lee, S.K. ; Park, H.C. ; Yoon, K.J.
出版情報: Smart structures and materials 2003 : Active materials : Behavior and mechanics : 3-6 March 2003, San Diego, California, USA.  pp.498-504,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5053
2.

国際会議録
国際会議録
2. Ultrasonic Cavity Sensors for Micro-Molding
Thomas, C.L. ; Lee, S.K. ; Cuff, D. ; Huilgol, N.N.
出版情報: ANTEC 2003, annual technical conference, May 4-8, Nashville, Tennessee.  pp.3295-3299,  2003.  Brookfield Center, Conn..  Society of Plastics Engineers
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 61
3.

国際会議録
国際会議録
3. Geometric Variation of Micro-Features in Injection Molding Experiment
Lee, S.K. ; Thomas, C.L.
出版情報: ANTEC 2003, annual technical conference, May 4-8, Nashville, Tennessee.  pp.597-601,  2003.  Brookfield Center, Conn..  Society of Plastics Engineers
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 61
4.

国際会議録
国際会議録
4. Nonlinear performance analysis of LIPCA actuator by using an assumed strain shell element
Lee, S.K. ; Park, H.C. ; Park, K.H. ; Yoon, K.J. ; Cho, C.
出版情報: Smart structures and materials 2003 : Modeling, signal processing, and control :3-6 March 2003, San Diego, California, USA, Ralph C. Smith, chairs/editors ; Sponsored by SPIE--The International Society for Optical Engineering.  pp.126-137,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5049
5.

国際会議録
国際会議録
5. New approach for pattern collapse problem by increasing contact area at sub-100nm patterning
Lee, S.-K. ; Jung, J.C. ; Lee, M.S. ; Lee, S.K. ; Kim, S.Y. ; Hwang, Y.-S. ; Bok, C.K. ; Moon, S.-C. ; Shin, K.S. ; Kim, S.-J.
出版情報: Advances in Resist Technology and Processing XX.  1  pp.166-174,  2003.  Bellingham, CA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5039