1.

国際会議録
国際会議録
1. Principles of highest-precision optical parts estimation on the basis of a point-diffraction interferometer
Voznesensky, N.B. ; Lee, K.-H. ; Kirillovsky, V.K.
出版情報: Optical fabrication, testing, and metrology : 30 September-3 October 2003, St. Etienne, France.  pp.241-251,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5252
2.

国際会議録
国際会議録
2. 1.32-μm YAG:Nd Q-switch laser with YAG:V3+ passive shutter
Ivanov, V. N. ; Sandulenko, A. V. ; Sandulenko, V. A. ; Mochalov, I. V. ; Ustyugov, V. I. ; Novikov, G. E. ; Kang, U. ; Lee, K.-H.
出版情報: Laser Optics 2003: Solid State Lasers and Nonlinear Frequency Conversion.  pp.26-30,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5478
3.

国際会議録
国際会議録
3. Simulation-based critical-area extraction and litho-friendly layout design for low-k1 lithography
Choi, S.-H. ; Ban, Y.-C. ; Lee, K.-H. ; Kim, D.-H. ; Hong, J.-S. ; Kim, Y.-H. ; Yoo, M.-H. ; Kong, J.-T.
出版情報: Optical Microlithography XVII.  pp.713-720,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5377
4.

国際会議録
国際会議録
4. Concept of far-field optical evaluation of the apparatus function of an SNOM tip
Voznesensky, N.B. ; Veiko, V.P. ; Ivanova, T.V. ; Lee, K.-H.
出版情報: Laser-Assisted Micro- and Nanotechnologies 2003.  pp.50-62,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5399
5.

国際会議録
国際会議録
5. Interferometers with diffraction on dot aperture for testing of shape errors of precise surfaces
Kirillovsky, V.K. ; Voznesensky, N.B. ; Troukhine, M.M. ; Lee, K.-H.
出版情報: Laser-Assisted Micro- and Nanotechnologies 2003.  pp.77-87,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 5399