1.
国際会議録
Ullmann,J. ; Mertin,M. ; Lauth,H. ; Bernitzki,H. ; Mann,K. ; Ristau,D. ; Arens,W. ; Thielsch,R. ; Kaiser,N.
出版情報:
Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado . pp.514-527, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3902
2.
国際会議録
Arens,W. ; Ristau,D. ; Ullmann,J. ; Zaczek,C. ; Thielsch,R. ; Kaiser,N. ; Duparre,A. ; Apel,O. ; Mann,K.R. ; Lauth,H. ; Bernitzki,H. ; Ebert,J. ; Schippel,St. ; Heyer,H.
出版情報:
Laser-induced damage in optical materials, 1999 : 31th Annual Boulder Damage Symposium, proceedings, 4-7, October, 1999, Boulder, Colorado . pp.250-259, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3902
3.
国際会議録
Schriever,G. ; Rahe,M. ; Neff,W. ; Bergmann,K. ; Lebert,R. ; Lauth,H. ; Basting,D.
出版情報:
Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA . pp.162-168, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
3997
4.
国際会議録
Dusterer,S. ; Rahe,M. ; Rebhan,U. ; Basting,D. ; Walecki,W.J. ; Lauth,H. ; Lebert,R. ; Bergmann,K. ; Hoffmann,D. ; Rosier,O. ; Neff,W. ; Poprawe,R. ; Sauerbrey,R.A. ; Schwoerer,H. ; Ziener,C. ; Nickles,P.V. ; Stiehl,H. ; Will,I. ; Sandner,W.
出版情報:
Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA . pp.113-120, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4146
5.
国際会議録
Laux,S. ; Bernitzki,H. ; Klaus,M. ; Lauth,H. ; Kaiser,N.
出版情報:
Laser-induced damage in optical materials, 2000 : 32nd Annual Boulder Damage Symposium, proceedings, 16-18, October, 2000, Boulder, Colorado . pp.13-16, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4347