1.

国際会議録
国際会議録
1. Study of stress-induced leakage current in thin oxides stressed by corona charging in air: Relationship to GOI defects
Wilson, M. ; Lagowski, J. ; Savtchou, A. ; Marinskiy, D. ; Jastrzebski, L. ; D'Amico, J.
出版情報: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.345-,  2000.  Warrendale, PA.  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 592
2.

国際会議録
国際会議録
2. Small signal AC-surface photovoltage technique for non-contact monitoring of near surface doping and recombination-generation in the depletion layer
Marinskiy, D. ; Lagowski, J. ; Wilson, M. ; Savtchouk, A. ; Jastrzebski, L. ; DeBusk, D.
出版情報: Nondestructive methods for materials characterization : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A..  pp.225-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 591
3.

国際会議録
国際会議録
3. SPV Monitoring of Near Surface Doping-Role of Boron-Hydrogen Interaction; Boron Passivation and Reactivation
Marinskiy, D. ; Lagowski, J.
出版情報: Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 669
4.

国際会議録
国際会議録
4. Non-Contact Doping Profiling in Epitaxial SiC
Savtchouk, A. ; Oborina, E. ; Hoff, A.M. ; Lagowski, J.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.755-758,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460