1.

国際会議録
国際会議録
1. SURFACE PHOTOVOLTAGE MEASUREMENT OF MINORITY CARRIER DIFFUSION LENGTHS EXCEEDING WAFER THICKNESS: APPLICATION TO IRON MONITORING WITH PART PER QUADILLION SENSITIVITY
Kontkiewicz, A. M. ; Lagowski, J. ; Dexter, M. ; Edelman, P.
出版情報: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.439-,  1994.  Pittsburgh.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 324
2.

国際会議録
国際会議録
2. Surface Photovoltage Characterization of Low Temperature Annealed LPCVD Silicon on Glass
Sen, S. ; Hoff, A.M. ; Moradi, B. ; Lagowski, J. ; Jastrzebski, L.
出版情報: Proceedings of the Second Symposium on Thin Film Transistor Technologies.  pp.269-278,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-35
3.

国際会議録
国際会議録
3. Analysis of Hydrogenation in Thin Film Polycrystalline Silicon Using Surface Photovoltage Measurement Technique
Henley, W. ; Ostepenko, S. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
出版情報: Proceedings of the Second Symposium on Thin Film Transistor Technologies.  pp.265-268,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-35
4.

国際会議録
国際会議録
4. Enhanced Hydrogenation of Interface Bulk and Surface Traps in Polycrystalline Silicon Thin Films Subjected to Ultrasound Treatment
Ostapenko, S. ; Karimpanakkel, S. ; Jastrzebski, L. ; Lagowski, J.
出版情報: Proceedings of the Second Symposium on Thin Film Transistor Technologies.  pp.61-67,  1994.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 1994-35