1.

国際会議録
国際会議録
1. Femtosecond spectroscopy of heme proteins
Champion,P.M. ; Rosca,F. ; Wang,W. ; Kumar,A. ; Christian,J. ; Demidov,A.
出版情報: Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California.  pp.80-89,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3273
2.

国際会議録
国際会議録
2. Fabrication of a single-to dual-mode fiber coupler for realizing two-mode fiber sensors
Kumar,A. ; Varshney,R.K. ; Mishra,G.C.
出版情報: Selected papers from Photonics India '98 : 14-18 December 1998, New Delhi, India.  pp.62-66,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3666
3.

国際会議録
国際会議録
3. Polychromatic light-based photorefractive correlator for 3D motion measurement
Kumar,A. ; Tripathi,R. ; Pati,G.S. ; Singh,K.
出版情報: Selected papers from International Conference on Optics and Optoelectronics '98 : Silber Jubilee Symposium of the Optical Society of India : 9-12 December 1998, Dehradun, India.  pp.101-106,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3729
4.

国際会議録
国際会議録
4. Disassembly problem in rapid prototyping
Ragade,R.K. ; Ikonen,I.T. ; Lewis,J.E. ; Biles,W.E. ; Kumar,A.
出版情報: Intelligent systems in design and manufacturing.  pp.36-44,  1998.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3517
5.

国際会議録
国際会議録
5. Using distributed genetic algorithms in three-dimensional bin packing for rapid prototyping machines
Lewis,J.E. ; Ragade,R.K. ; Kumar,A. ; Biles,W.E. ; Ikonen,I.T.
出版情報: Intelligent systems in design and manufacturing.  pp.45-53,  1998.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3517
6.

国際会議録
国際会議録
6. Ultrashort transient pulse propagation effect in semiconductor waveguides under a nonlinear dispersion regime
Sen,P.K. ; Kumar,A. ; Sen,P.
出版情報: Optical pulse and beam propagation : 27-28 January, 1999, San Jose, California.  pp.269-275,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3609
7.

国際会議録
国際会議録
7. GARP:genetic algorithm for part packing in a rapid prototyping machine
Ikonen,I.T. ; Biles,W.E. ; Lewis,J.E. ; Kumar,A. ; Ragade,R.K.
出版情報: Intelligent systems in design and manufacturing.  pp.54-62,  1998.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3517
8.

国際会議録
国際会議録
8. Nonisothermal Crystallization of Se70Te26Sb4 Glass
Predeep,P. ; Saxena,N.S. ; Saksena,M.P. ; Kumar,A.
出版情報: Disordered materials -current developments- : proceedings of the International Seminar on Current Developments in Disordered Materials, held in Kurukshetra, India, January 1996 : CDDM-96.  pp.91-94,  1996.  Zuerich-Uetikon, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 223-224
9.

国際会議録
国際会議録
9. High Current Pulsed Positron Microprobe
Howell,R.H. ; Stoeffl,W. ; Kumar,A. ; Steme,P.A. ; Cowan,T.E. ; Hartley,J.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.644-646,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
10.

国際会議録
国際会議録
10. Arsenic-Antisite-Related Defects in GaAs Grown at Low Temperature:Characterization of Localized States
Landman,J.I. ; Morgan,C.G. ; Schick,J.T. ; Kumar,A. ; Papoulias,P. ; Kramer,M.F.
出版情報: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.249-254,  1995.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 196-201