1.

国際会議録
国際会議録
1. Vacancy Defects in Low-Temperature-Grown GaAs Observed by Continuous and Pulsed Slow Positrons
Gebauer,J. ; Krause-Rehberg,R. ; Eichler,S. ; Bauer-Kugelmann,W. ; Kogel,G. ; Triftshauser,W. ; Luysberg,M. ; Sohn,H. ; Weber,E.R.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.204-208,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
2.

国際会議録
国際会議録
2. Positron annihtlation and scanning tunneling microscopy used to characterise defects in highly Si-doped GaAs.(Invited)
Gebauer,J. ; Krause-Rehberg,R. ; Domke,C. ; Ebert,Ph. ; Urban,K.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.885-892,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
3.

国際会議録
国際会議録
3. Fluence Dependence of the Formation of Open-Volume Defects in Silicon After Ion Implantation
Eichler,S. ; Borner,F. ; Gebauer,J. ; Krause-Rehberg,R.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.472-474,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
4.

国際会議録
国際会議録
4. Positron Annihilation in Fine Powders and Fine-Grained Materials
Staab,T.E.M. ; Krause-Rehberg,R.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.479-481,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
5.

国際会議録
国際会議録
5. Study of Irradiation-Induced Vacancy Defects and Shallow Positron Traps in Silicon
Polity,A. ; Huth,S. ; Krause-Rehberg,R.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.602-604,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
6.

国際会議録
国際会議録
6. Study ofplastically deformed semiconductors by means of positron annihilation
Leipner,H.S. ; Hubner,C.G. ; Kruger,J. ; Krause-Rehberg,R.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.981-986,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
7.

国際会議録
国際会議録
7. Equilibrium vacancies in Te-doped GaAs studied by positron annihilation
Gebauer,J. ; Krause-Rehberg,R. ; Laustnann,M. ; Lippold,G.
出版情報: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.905-910,  1997.  Zurich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 258-263
8.

国際会議録
国際会議録
8. Positron Lifetime Spectroscopy on Laser-Hardened Carbon Steels
Somieski,B. ; Meyendorf,N. ; Arloth,M. ; Krause-Rehberg,R.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.584-586,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
9.

国際会議録
国際会議録
9. Deformation Induced Defects in GaAs-the Role of Dislocations
Hubner,C.G. ; Leipner,H.S. ; Krause-Rehberg,R.
出版情報: Positron annihilation, ICPA-11 : Proceedings of the 11th International Conference on Positron Annihilation, Kansas City, Missouri, USA, May 1997.  pp.497-499,  1997.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 255-257
10.

国際会議録
国際会議録
10. Morphologic defects in Cr3+:LiCaAIF6 crystals grown by the Czochralski method
Klimm,D. ; Seiranian,K. ; Reiche,P. ; Polity,A ; Krause-Rehberg,R.
出版情報: Solid state crystals, growth and characterization : 7-11 October 1996, Zakopane, Poland.  pp.35-41,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 3178