1.

国際会議録
国際会議録
1. Laser synthesis of single-wall carbon nanotubes with time-resolved in situ diagnostics (Invited Paper)
Geohegan, D.B. ; Puretzky, A.A. ; Schittenhelm, H. ; Fan, X. ; Britt, P.F. ; Guillorn, M.A. ; Simpson, M.L. ; Merkulov, V.I. ; Austin, D.W. ; Pennycook, S.J. ; Joy, D.C.
出版情報: ALT'01 International Conference on Advanced Laser Technologies, 11-14 September, 2001, Constanta, Romania.  pp.268-277,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4762
2.

国際会議録
国際会議録
2. Future of e-beam metrology: obstacles and opportunities (Keynote Paper)
Joy, D.C.
出版情報: Metrology, Inspection, and Process Control for Microlithography XVI.  Part One  pp.1-10,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4689
3.

国際会議録
国際会議録
3. Low-voltage-point source microscope for interferometry
Frost, B.G. ; Joy, D.C. ; Thesen, A.
出版情報: Metrology, Inspection, and Process Control for Microlithography XVI.  Part One  pp.576-583,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4689
4.

国際会議録
国際会議録
4. Simulation of imaging in projection microscope using multibeam probe
Ko, Y.-U. ; Joy, D.C.
出版情報: Metrology, Inspection, and Process Control for Microlithography XVI.  Part One  pp.565-575,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4689
5.

国際会議録
国際会議録
5. Laser synthesis of single-wall carbon nanotubes with time-resolved in-situ diagnostics
Geohegan, D.B. ; Puretzky, A.A. ; Schittenhelm, H. ; Fan, X. ; Britt, P.F. ; Guillorn, M.A. ; Simpson, M.L. ; Merkulov, V.I. ; Austin, D.W. ; Pennycook, S.J. ; Joy, D.C.
出版情報: Nanoscience Using Laser-Solid Interactions.  pp.1-10,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
シリーズ名: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号: 4636