Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA. pp.243-250, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Wakana, H. ; Yamamoto, S.-I. ; Obara, N. ; Ikeda, M. ; Saito, H.
出版情報:
AP 2000 : millennium Conference on Antennas & Propagation, Davos, Switzerland, 9-14 April 2000. 2000. Noordwijk, Netherlands. ESA Publications Division
Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China. pp.154-159, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.31-36, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Medical imaging 2003 : Image perception, observer performance, and technology assessment : 18-20 February 2003, San Diego, California, USA. pp.383-392, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Akiyoshi, K. ; Ikeda, M. ; Sasaki, Y. ; Sunamoto, J.
出版情報:
Proceedings of the International Conference on Colloid and Surface Science, Tokyo, Japan, November 5-8, 2000 : 25th Anniversary of the Division of Colloid and Surface Chemistry, the Chemical Society of Japan. pp.89-92, 2001. Amsterdam. Elsevier
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, Chin. pp.493-496, 2005. Uetikon-Zuerich. Trans Tech Publications
Imai, K. ; Maruyama, S. ; Suzuld, T. ; Kudo, T. ; Miyake, S. ; Ikeda, M. ; Abe, T. ; Masuda, S. ; Tanabe, A. ; Lee, J-W. ; Shibahara, K. ; Yokoyania, S. ; Qoka, H.
出版情報:
Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.149-158, 2003. Pennington, N.J.. Electrochemical Society
GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A.. pp.839-844, 2002. Warrendale, Pa.. Materials Research Society
Imai, K. ; Maruyama, S. ; Suzuki, T. ; Kudo, T. ; Miyake, S. ; Ikeda, M. ; Abe, T. ; Masuda, S. ; Tanabe, A. ; Lee, J.-W. ; Shibahara, K. ; Yokoyama, S. ; Ooka, H.
出版情報:
ULSI Process Integration : proceedings of the International Symposium. pp.493-502, 2003. Pennington, N.J.. Electrochemical Society
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.31-36, 2003. Pennington, NJ. Electrochemical Society
Ikeda, M. ; Mori, M. ; Hirasawa, T. ; Toyoshima, K.
出版情報:
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.2337-2342, 2005. Uetikon-Zuerich. Trans Tech Publications
Ikeda, M. ; Komatsu, S. ; Nakamura, Y. ; Kobayashi, Y.
出版情報:
Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003. pp.1273-1276, 2004. Zuerich. Trans Tech Publications
THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain. pp.3165-3170, 2003. Zuerich-Uetikon, Switzerland. Trans Tech Publications
Yamamoto, A. ; Kakishiro, M. ; Ikeda, M. ; Tsubakino, H.
出版情報:
Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003. pp.669-672, 2004. Zuerich. Trans Tech Publications
Kurihara, T. ; Nagashima, Y. ; Shidara, T. ; Nakajima, H. ; Ohsawa, S. ; Ikeda, M. ; Oogoe, T. ; Kakihara, K. ; Ogawa, Y. ; Shirakawa, A. ; Furukawa, K. ; Sanami, T. ; Enomoto, A.
出版情報:
Positron annihilation ICPA-13 : proceedings of the 13th International Conference on Positron Annihilation, Kyoto, Japan, September 2003. pp.486-488, 2004. Uetikon-Zuerich. Trans Tech Publications
A collection of the 21st AIAA International Communications Satellite Systems Conference and Exhibit technical papers, Yokohama, Japan, 15-19 April 2003. v. 2 pp.1197-1203, 2003. Reston, Va. American Institute of Aeronautics and Astronautics
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AIAA Paper : AIAA International Communications Satellite Systems Conference
Horii, A. ; Takamura, M. ; Ichikawa, K. ; Kodera. Y. ; Ikeda, M. ; Ishigaki, T.
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Medical Imaging 2006: Visualization, Image-Guided Procedures, and Display. pp.61411P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Ishigaki, T. ; Ikeda, M. ; Usami, H. ; Hidano, S. ; Shimamoto, K. ; Kodera, Y.
出版情報:
Medical Imaging 2002: Image Perception, Observer Performance, and Technology Assessment. pp.347-354, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Tsuchiya, H. ; Isomura, I. ; Nakashima, K. ; Yamashita, K. ; Watanabe, T. ; Nishizaka, T. ; Ikeda, H. ; Sawa, E. ; Ikeda, M.
出版情報:
Photomask and Next-Generation Lithography Mask Technology IX. pp.526-533, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Yoshikawa, R. ; Tanizaki, H. ; Watanabe, T. ; Inoue, H. ; Ogawa, R. ; Endo, S. ; Ikeda, M. ; Takahashi, Y. ; Watanabe, H.
出版情報:
Photomask and Next-Generation Lithography Mask Technology XI. pp.313-319, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
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