1.

国際会議録
国際会議録
1. DAMAGE FORMATION IN SEMICONDUCTORS DURING MeV ION IMPLANTATION
Sjoreen, T.P. ; Holland, O.W. ; El-Ghor, M.K. ; White, C.W.
出版情報: Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.593-598,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 128
2.

国際会議録
国際会議録
2. METAL SILICIDES FORMED BY DIRECT ION BEAM DEPOSITION
Zuhr, R.A. ; Pennycook, S.J. ; Haynes, T.E. ; Holland, O.W.
出版情報: Processing and characterization of materials using ion beams : symposium held November 28-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.47-54,  1989.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 128
3.

国際会議録
国際会議録
3. Solute segregation and dynamics of solid-phase crystallization in In and Sb-implanted silicon
Narayan, J. ; Olson, G.L. ; Holland, O.W.
出版情報: Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.183-188,  1982.  New York.  North Holland
シリーズ名: Materials Research Society symposia proceedings
シリーズ巻号: 4