1.

国際会議録
国際会議録
1. Structural Characterization of SiC Epitaxial Layers Grown on Porous SiC Substrates
Saddow, S.E. ; Melnychuk, G. ; Mynbaeva, M. ; Nikitina, I. ; Vetter, W.M. ; Jin, L. ; Dudley, M. ; Shamsuzzoha, M. ; Dmitriev, V. ; Wood, C.E.C
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640
2.

国際会議録
国際会議録
2. The Effect of Surface Finish on the Dislocation Density in Sublimation Grown SiC Layers
Sanchez, E. K. ; Liu, J. ; Skowronski, M. ; Vetter, W. M. ; Dudley, M. ; Bertke, R. ; Mitchel, W.C.
出版情報: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 640