1.

国際会議録
国際会議録
1. Plastics Failure Due to Oxidative Degradation in Processing and Service
Ezrin, M. ; Zepke, A. ; Helwig, J. ; Lavigne, G. ; Dudley, M.
出版情報: ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida.  pp.3108-3112,  2000.  Brookfield Center, CT.  Society of Plastics Engineers, Inc. (SPE)
シリーズ名: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
シリーズ巻号: 46
2.

国際会議録
国際会議録
2. Dislocation motion around loaded notches in ice single crystals
Cullen, D. ; Hu, X. ; Baker, I. ; Dudley, M.
出版情報: Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.291-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 590
3.

国際会議録
国際会議録
3. Characterization of SiC Using Synchrotron White Beam X-Ray Topography
Dudley, M. ; Huang, X.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.431-436,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
4.

国際会議録
国際会議録
4. Correlation of EBIC and SWBXT Imaged Defects and Epilayer Growth Pits in 6H-SiC Schottky Diodes
Schnabel, C. M. ; Tabib-Azar, M. ; Neudeck, P. G. ; Bailey, S. G. ; Su, H. B. ; Dudley, M. ; Raffaelle, R. P.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.489-492,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
5.

国際会議録
国際会議録
5. X-Ray Characterization of 3 Inch Diameter 4H and 6H-SiC Experimental Wafers
Kuhr, T. A. ; Vetter, W. M. ; Dudley, M. ; Skowronski, M.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.473-476,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
6.

国際会議録
国際会議録
6. Structural Investigation on the Nature of Surface Defects Present in Silicon Carbide Wafers Containing Varying Amount of Micropipes
Shamsuzzoha, M. ; Saddow, S. E. ; Schattner, T. E. ; Jin, L. ; Dudley, M. ; Rendakova, S. V. ; Dmitriev, V. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.453-456,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
7.

国際会議録
国際会議録
7. Synchrotron White Beam X-Ray Topography and Atomic Force Microscopy Studies of a 540R-SiC Lely Platelet
Vetter, W. M. ; Dudley, M. ; Huang, W. ; Neudeck, P. ; Powell, J. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.469-472,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)
8.

国際会議録
国際会議録
8. Synchrotron White Beam Topography Studies of 2H SiC Crystals
Dudley, M. ; Huang, W. ; Vetter, W. M. ; Neudeck, P. ; Powell, J. A.
出版情報: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.465-468,  2000.  Zuerich, Switzerland.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 338-342(1)