1.

国際会議録
国際会議録
1. CHARACTERIZATION OF GROWTH DEFECTS IN ZnTe SINGLE CRYSTALS
Zhou, W. ; Wu, J. ; Dudley, M. ; Su, C.H. ; Volz, M.P. ; Gillies, D.C. ; Szofran, F.R. ; Lehoczky, S.L.
出版情報: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.203-208,  1994.  Pittsburgh, PA.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 299
2.

国際会議録
国際会議録
2. DETERMINATION OF 3-DIMENSION DEFECT STRUCTURES IN GALLIUM ARSENIDE EPILAYERS ON SILICON USING WHITE BEAM SYNCHROTRON RADIATION TOPOGRAPHY IN BOTH TRANSMISSION AND GRAZING BRAGG-LAUE GEOMETRY
Dudley, M. ; Yao, G.-D. ; Wu, J. ; Liu, H.Y. ; Kao, Y.C.
出版情報: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.469-474,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 160
3.

国際会議録
国際会議録
3. Characterization of growth defects in ZnTe single Crystals
Zhou, W. ; Wu, J. ; Dudley, M. ; Su, C. H. ; Volz, M. P. ; Gillies, D. C. ; Szofran, F. R. ; Lehoczky, S. L.
出版情報: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.451-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 302
4.

国際会議録
国際会議録
4. Characterization of Growth Defects in CdZnTe Single Crystals by Synchrotron White Beam X-ray Topography
Chung, H. ; Raghothamachar, B. ; Wu, J. ; Dudley, M. ; Larson, D. J., Jr. ; Gillies, D. C.
出版情報: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.41-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 378
5.

国際会議録
国際会議録
5. DEPTH SENSITIVE IMAGING OF DEFECS IN EPILAYERS AND SINGLE CRYSTALS USING WHITE BEAM SYNCHROTRON RADIATION TOPOGRAPHY IN GRAZING BRAGG-LAUE GEOMETRY
Dudley, M. ; Yao, G.-D. ; Wu, J. ; Liu, H.-Y.
出版情報: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.1031-1036,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 163