1.

国際会議録
国際会議録
1. X-RAY TOPOGRAPHIC ANALYSIS OF STRAIN FIELDS ASSOCIATED WITH MICRON-SIZED GRATINGS ON Si(100) SURFACES
Jardine, A.P. ; Dudley, M. ; Tolis, G. ; Yao, G.-D. ; Durbin, S.M.
出版情報: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.533-538,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 160
2.

国際会議録
国際会議録
2. DETERMINATION OF 3-DIMENSION DEFECT STRUCTURES IN GALLIUM ARSENIDE EPILAYERS ON SILICON USING WHITE BEAM SYNCHROTRON RADIATION TOPOGRAPHY IN BOTH TRANSMISSION AND GRAZING BRAGG-LAUE GEOMETRY
Dudley, M. ; Yao, G.-D. ; Wu, J. ; Liu, H.Y. ; Kao, Y.C.
出版情報: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.469-474,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 160
3.

国際会議録
国際会議録
3. THE APPLICATION OF NEUTRON TOPOGRAPHY TO THE STUDY OF X-RAY SENSITIVE ORGANIC CRYSTALS - A POSSIBLE ALTERNATIVE TO X-RAY TOPOGRAPHY
Dudley, M.
出版情報: Neutron scattering for materials science : symposium held November 27-30, 1989, Boston, Massachusetts, U.S.A..  pp.55-60,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 166
4.

国際会議録
国際会議録
4. DEPTH SENSITIVE IMAGING OF DEFECS IN EPILAYERS AND SINGLE CRYSTALS USING WHITE BEAM SYNCHROTRON RADIATION TOPOGRAPHY IN GRAZING BRAGG-LAUE GEOMETRY
Dudley, M. ; Yao, G.-D. ; Wu, J. ; Liu, H.-Y.
出版情報: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.1031-1036,  1990.  Pittsburgh, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 163