Trauwaert, M.-A. ; Vanhellemont, J. ; Simoen, E. ; Claeys, C. ; Johlander, B. ; Harboe-Sorensen, R. ; Adams, L. ; Clauws, P.
出版情報:
Beam-solid interactions : fundamentals and applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.93-98, 1993. Pittsburgh, Pa.. Materials Research Society
Ohyama, H. ; Simoen, E. ; Claeys, C. ; Takami, Y. ; Kawamura, K. ; Hakata, T. ; Sunaga, H. ; Ogita, Y.
出版情報:
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.289-294, 1997. Pennington, NJ. Electrochemical Society
Vanhellemont, J. ; Simoen, E. ; Bosman, G. ; Claeys, C. ; Kaniava, A. ; Gaubas, E. ; Blondeel, A. ; Clauws, P.
出版情報:
Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.670-683, 1994. Pennington, NJ. Electrochemical Society
Croon, J. ; Biesemans, S. ; Kubicek, S. ; Simoen, E. ; De Meyer, K. ; Claeys, C.
出版情報:
Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity. pp.187-198, 1997. Pennington, NJ. Electrochemical Society
Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity. pp.117-139, 1997. Pennington, NJ. Electrochemical Society
Nicolett, A.S. ; Martino, J.A. ; Simoen, E. ; Claeys, C.
出版情報:
Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity. pp.159-170, 1997. Pennington, NJ. Electrochemical Society
Kissinger, G. ; Vanhellemont, J. ; Graef, D. ; Zulehner, W. ; Claeys, C. ; Richter, H.
出版情報:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands. pp.156-164, 1995. Pennington, NJ. Electrochemical Society
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices. pp.81-85, 1997. Pennington, NJ. Electrochemical Society
Libezny, M. ; Kaniava, A. ; Kissinger, G. ; Nijs, J. ; Claeys, C. ; Vanhellemont, J.
出版情報:
ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands. pp.165-172, 1995. Pennington, NJ. Electrochemical Society