Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California. pp.219-224, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Laser techniques for condensed-phase and biological systems : 29-31 January 1998, San Jose, California. pp.214-218, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Computer-aided design and computer graphics : Fourth International Conference on Computer-Aided Design and Computer Graphics : 23-25 October, 1995, Wuhan, China. pp.693-698, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Intelligent robots and computer vision XVIII : Algorithms, techniques, and active vision : 20-21 September 1999, Boston, Massachusetts. pp.127-135, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Intelligent robots and computer vision XVIII : Algorithms, techniques, and active vision : 20-21 September 1999, Boston, Massachusetts. pp.108-117, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China. pp.487-490, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China. pp.124-128, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing. pp.41-48, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering