1.

国際会議録
国際会議録
1. In Situ Monitoring of Thin Film Reactions During Rapid Thermal Annealing: Nickel Silicide Formation
Lavoje, C. ; Purtell, R. ; Cola, C. ; Detavernier, C. ; Desjardins, P. ; Jordan-Sweet, J. ; Cabral, C., Jr. ; d'Heurle, F.M. ; Harper., J.M.E.
出版情報: Rapid thermal and other short-time processing technologies III : proceedings of the international symposium.  pp.455-468,  2002.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2002-11
2.

国際会議録
国際会議録
2. 46 Evaluation of CMOS gate metal materials using in situ characterization techniques
Cabral, C., Jr. ; Lavoje, C. ; Ozcan, A.S. ; Amos, R.S. ; Naroyanan, V. ; Gusev, E.P. ; Jordan-Sweet, J.L. ; Harpe, J.M.E.
出版情報: Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium.  pp.375-384,  2003.  Pennington, NJ.  Electrochemical Society
シリーズ名: Electrochemical Society Proceedings Series
シリーズ巻号: 2003-14
3.

国際会議録
国際会議録
3. A Self-Aligned Silicide Process Utilizing Ion Implants For Reduced Silicon Consumption And Control Of The Silicide Formation Temperature
Cohen, G.M. ; Cabral, C., Jr. ; Lavoie, C. ; Solomon, P.M. ; Guarini, K.W. ; Chan, K.K. ; Roy, R.A.
出版情報: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.35-40,  2002.  Warrendale.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 716
4.

国際会議録
国際会議録
4. Cu and Dilute Binary Cu(Ti),Cu(Sn) and Cu(Al) thin Films: Texture, Grain Growth and Resistivity
Gungor, A. ; Barmak, K. ; Rollett, A.D. ; Cabral, C., Jr. ; Harper, J.M.E.
出版情報: Magnetic and electronic films : microstructure, texture and application to data storage : symposium held April 1-4, 2002, San Francisco, California, U.S.A..  pp.61-66,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 721
5.

国際会議録
国際会議録
5. In-situ Studies of Silicide Formation in Ti-Ta Bilayer Thin Films on Poly-Si
Ozcan, A.S. ; Ludwig K.F., Jr. ; Lavoie, C. ; Cabral, C., Jr. ; Harper, J.M.E.
出版情報: Magnetic and electronic films : microstructure, texture and application to data storage : symposium held April 1-4, 2002, San Francisco, California, U.S.A..  pp.43-50,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 721
6.

国際会議録
国際会議録
6. A Self-Aligned Silicide Process for Thin Silicon-on-Insulator MOSFETs and Bulk MOSFETs With Shallow Junctions
Cohen, G.M. ; Cabral, C., Jr. ; Lavoie, C. ; Solomon, P.M. ; Guarini, K.W. ; Chan, K.K. ; Roy, R.A.
出版情報: Materials issues in novel si-based technology : symposium held November 26-28, 2001, Boston, Massachusetts, U.S.A..  pp.89-94,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 686
7.

国際会議録
国際会議録
7. The Growth Of Tantalum Thin Films By Plasma-Enhanced Atomic Layer Deposition And Diffusion Barrier Properties
Kim, H. ; Cabral, C., Jr. ; Lavoie, C. ; Rossnagel, S.M.
出版情報: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.407-412,  2002.  Warrendale.  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 716
8.

国際会議録
国際会議録
8. Characterization And Monitoring Of Silicon-On-Insulator Fabrication Processes By High-Resolution X-Ray Diffraction
Cohen, G.M. ; Mooney, P.M. ; Park, H. ; Cabral, C., Jr. ; Jones, E.C.
出版情報: Silicon front-end junction formation technologies : symposium held April 2-4, 2002, San Francisco, California, U.S.A..  pp.89-94,  2002.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 717
9.

国際会議録
国際会議録
9. Electrodes and Barriers for DRAM and FERAM: Processing, Integration, and Fundamentals
Saenger, K.L. ; Andricacos, P.C. ; Athavale, S.D. ; Baniecki, J.D. ; Cabral, C., Jr. ; Costrini, G. ; Kwietniak, K.T. ; Laibowitz, R.B. ; Lian, J.J. ; Limb, Y. ; Neumayer, D.A. ; Wise, M.L.
出版情報: Ferroelectric thin films IX : symposium held November 26-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
シリーズ名: Materials Research Society symposium proceedings
シリーズ巻号: 655