Photo-induced current spectroscopy in undoped CVD diamond films
- 著者名:
Borchi, E. Bruzzi, M. Lombardi, L. Menichielli, D. Miglio, S. Pirollo, S. Sciortino, S. Serafini, D. - 掲載資料名:
- Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 588
- 発行年:
- 2000
- 開始ページ:
- 277
- 出版情報:
- Warrendale, Pa.: MRS-Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994966 [1558994963]
- 言語:
- 英語
- 請求記号:
- M23500/588
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
8
国際会議録
MODIFICATION OF METAL-SEMICONDUCTOR RECTIFYING CONTACTS ON CVD DIAMOND FILMS BY ION IMPLANTATION
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
MRS - Materials Research Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
Electrochemical Society |
MRS - Materials Research Society |
MRS - Materials Research Society |
12
国際会議録
Investigation of Trapping Properties in SIMOX Films by Photo-Irrduced Current Transient Spectroscopy
Trans Tech Publications |