Health monitoring and smart nondestructive evaluation of structural and biological systems V : 27 February-1 March 2006, San Diego, California, USA. pp.617709-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Health monitoring and smart nondestructive evaluation of structural and biological systems V : 27 February-1 March 2006, San Diego, California, USA. pp.61770Y-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Deen, M. J. ; Marinov, O. ; Onsongo, D. ; Dey, S. ; Banerjee, S.
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Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.215-225, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA. pp.1-10, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA. pp.42-52, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA. pp.89-98, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
Ngai, T. ; Sharma, R. ; Fretwell, J. ; Chen, X. ; Chen, J. ; Brookover, W. ; Banerjee, S.
出版情報:
Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium. pp.95-108, 2001. Pennington, N.J.. Electrochemical Society
Mal, A. K. ; Banerjee, S. ; Ricci, F. ; Monaco, E. ; Lecce, L.
出版情報:
Health monitoring and smart nondestructive evaluation of structural and biological systems V : 27 February-1 March 2006, San Diego, California, USA. pp.617701-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium. pp.329-337, 2003. Pennington, NJ. Electrochemical Society
Sensors and camera systems for scientific, industrial, and digital photography applications V : 19-21 January, 2004, San Jose, California, USA. pp.364-373, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering