1.

国際会議録
国際会議録
1. Microwave Dielectric Loss Characterization of Silicon Carbide Wafers
Bogart, T. ; Everson, B. ; Gamble, R.D. ; Oslosky, E. ; Snyder, D.W. ; Furman, E. ; Perini, S. ; Lanagan, M.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.733-738,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
2.

国際会議録
国際会議録
2. Growth of SiC Boules with Low Boron Concentration
Fanton, M.A. ; Cavalero, R.L. ; Ray, R.G. ; Weiland, B.E. ; Everson, W. ; Snyder, D.W. ; Gamble, R.D. ; Oslosky, E.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.47-50,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
3.

国際会議録
国際会議録
3. Preparation and Evaluation of Damage Free Surfaces on Silicon Carbide
Everson, W.J. ; Heydemann, V.D. ; Gamble, R.D. ; Snyder, D.W. ; Goda, G. ; Skowronski, M. ; Grim, J. ; Berkman, E. ; Redwing, J.M. ; Acord, J.D.
出版情報: Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005.  pp.1091-1094,  2006.  Stafa-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 527-529
4.

国際会議録
国際会議録
4. Chemi-Mechanical Polishing of On-Axis Semi-Insulating SiC Substrates
Heydemann, V.D. ; Everson, W.J. ; Gamble, R.D. ; Snyder, D.W. ; Skowronski, M.
出版情報: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.805-808,  2004.  Uetikon-Zuerich.  Trans Tech Publications
シリーズ名: Materials science forum
シリーズ巻号: 457-460