Enhanced Dimension-Reduction (eDR) Method for Sensitivity-Free Uncertainty Quantification

Enhanced Dimension-Reduction (eDR) Method for Sensitivity-Free Uncertainty Quantification

著者名:

B. Youn ( Michigan Technological University, Houghton, MI )
Z. Xi
L. Wells
P. Wang

掲載資料名:

AIAA meeting papers on disc

シリーズ名:

AIAA Paper : Multidisciplinary Analysis and Optimization Conference

シリーズ巻号:

2006

発行年:

2006

通号:

2006-6977

ペーパー番号:

AIAA Paper 2006-6977

出版情報:

Reston, Va: American Institute of Aeronautics and Astronautics

ISSN:

10877215

言語:

英語

請求記号:

A07400/200621 [CD-ROM 2006 Disc 21]

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00047250
シリーズID:	PA00000051
会議名:	AIAA/ISSMO Multidisciplinary Analysis and Optimization Conference
回次:	11th
会議開催地:	Portsmouth, Virginia
会議開催年:	2006.09.06-2006.09.08

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