X-Ray Diffraction Residual Stress measurements on Surface Treated Ti-6AI-4V for Aerospace Applications.

X-Ray Diffraction Residual Stress measurements on Surface Treated Ti-6AI-4V for Aerospace Applications.

著者名:

掲載資料名:

AIAA paper

シリーズ名:

AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit

シリーズ巻号:

2002

発行年:

2002

通号:

2002-3733

ペーパー番号:

2002-3733

総ページ数:

8

出版情報:

American Institute of Aeronautics and Astronautics

ISSN:

01463705

言語:

英語

請求記号:

A07400

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00001704
シリーズID:	PA00000151
会議名:	AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
回次:	38th
会議開催地:	Indianapolis, IN
会議開催年:	2002.07.07-2002.07.10
論文注記:	38th AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit, Indianapolis, Indiana, 7-10 July 2002

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