X-ray photoelectron spectroscopy (XPS), Rutherford Back Scattering (RBS) studies

X-ray photoelectron spectroscopy (XPS), Rutherford Back Scattering (RBS) studies

著者名:

Neely, W.C. ( Space Power Institute Auburn University )
Bozak, M.J.
Williams, J.R.

掲載資料名:

NASA Technical Reports

発行年:

1993

号:

NASA-CR-196536

通号:

G3/25 0030469

パート:

NAS 1.26:196536

ペーパー番号:

N95-14867

開始ページ:

1

終了ページ:

41

総ページ数:

41

出版情報:

National Aeronautics and Space Adminstration

言語:

英語

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00001431
論文注記:	NAS8-39131

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