Analysis of Strain Relaxation in Au/Ni Multilayers by X-Ray Diffraction
- 著者名:
- Chaudhuri, J. ( INSTITUTE FOR AVIATION RESEARCH WICHITA STATE UNIVERSITY )
- Gondhalekar, V.
- Shah, S.
- Jankowski, A.F.
- 掲載資料名:
- NASA Technical Reports
- 発行年:
- 1989
- 通号:
- H2/39 0291520
- ペーパー番号:
- N90-26357
- 開始ページ:
- 1
- 終了ページ:
- 8
- 総ページ数:
- 8
- 出版情報:
- National Aeronautics and Space Adminstration
- 言語:
- 英語
- 資料種別:
- テクニカルペーパー
類似資料:
Materials Research Society |
7
テクニカルペーパー
Characterization of Composition and Strain in Annealed Cu-Ni Multilayers Using X-Ray Diffraction
National Aeronautics and Space Adminstration |
Materials Research Society |
8
テクニカルペーパー
Comparative Study of Phosphosilicate Glass on (100) Silicon by Furnace and Rapid Isothermal Annealing
National Aeronautics and Space Adminstration |
Materials Research Society |
Society of Automotive Engineers |
MRS - Materials Research Society |
Society of Automotive Engineers |
National Aeronautics and Space Adminstration |
Society of Automotive Engineers |
National Aeronautics and Space Adminstration |
12
テクニカルペーパー
Direct Evidence of the Interplanetary Magnetic Field Effect on the Cosmic-Ray Shadow by the Sun
National Aeronautics and Space Adminstration |