International risk-based inspection technology developments

International risk-based inspection technology developments

著者名:

Balkey, K. R. ( ASME Center for Research and Technology Development )
Ayyub, B. M.
Chapman, O. J. V.

掲載資料名:

A.S.M.E. paper

シリーズ名:

ASME Technical Paper : WA/SAF

シリーズ巻号:

1992

発行年:

1992

通号:

92-WA/SAF-2

ペーパー番号:

92-WA/SAF-2

出版情報:

New York, NY: The American Society of Mechanical Engineers

言語:

英語

請求記号:

A11800

資料種別:

テクニカルペーパー

詳細

TDL書誌ID:	ZA00002738
シリーズID:	PA00000225
会議名:	Winter Annual Meeting
回次:	1992
会議開催地:	Anaheim, CA
会議開催年:	1992.11.08-1992.11.13
論文注記:	Presented at the Winter Annual Meeting November 8-13, 1992 - Anaheim, CA

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