Blank Cover Image

Electrical Stability Impact of Gate Oxide in Channel Implanted SiC NMOS and PMOS Transistors

著者名:
M.I. Idris
M.H. Weng
H.K. Chan
A.E. Murphy
D.A. Smith
R.A.R. Young
E.P. Ramsay
D.T. Clark
N.G. Wright
A.B. Horsfall
さらに 5 件
掲載資料名:
Silicon Carbide and Related Materials 2016
シリーズ名:
Materials science forum
シリーズ巻号:
897
発行年:
2017
開始ページ:
513
終了ページ:
516
総ページ数:
4
出版情報:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9783035710434 [3035710430]
言語:
英語
請求記号:
M23650
資料種別:
国際会議録

類似資料:

1 国際会議録 Analytical Evaluation of Thermally Oxidized and Deposited Dielectric in NMOS-PMOS devices

M.H. Weng, M.I. Idris, H.K. Chan, A.E. Murphy, D.A. Smith

Trans Tech Publications
7 国際会議録 Reliability Evaluation of 4H-SiC JFETs Using I-V Characteristics and Low Frequency Noise

H.K. Chan, R.C. Stevens, J.P. Goss, N.G. Wright, A.B. Horsfall

Trans Tech Publications
2 国際会議録 Low Frequency Noise Analysis of Monolithically Fabricated 4H-SiC CMOS Field Effect Transistors

L.C. Martin, H.K. Chan, D. Clark, E.P. Ramsay, A.E. Murphy

Trans Tech Publications
8 国際会議録 Low Frequency Noise in 4H-SiC Lateral JFET Structures

H.K. Chan, R.C. Stevens, J.P. Goss, N.G. Wright, A.B. Horsfall

Trans Tech Publications
3 国際会議録 Silicon Carbide Static Induction Transistor with Implanted Buried Gate

K.V. Vassilevski, I.P. Nikitina, A.B. Horsfall, N.G. Wright, A.G. O'Neill

Trans Tech Publications
9 国際会議録 High Temperature Digital and Analogue Integrated Circuits in Silicon Carbide

R.A.R. Young, D. Clark, J.D. Cormack, A.E. Murphy, D.A. Smith

Trans Tech Publications
4 国際会議録 Silicon Carbide Radiation Detectors for Medical Applications

N.S. Mohamed, M.I. Idris, N.G. Wright, A.B. Horsfall

Trans Tech Publications
10 国際会議録 Trap Assisted Gas Sensing Mechanism in MISiC Capacitors

A. Horsfall, M.H. Weng, R. Mahapatra, N.G. Wright

Trans Tech Publications
5 国際会議録 Post Metallization Annealing Characterization of Interface Properties of High-κ Dielectrics Stack on Silicon Carbide

M.H. Weng, R. Mahapatra, N.G. Wright, A.B. Horsfall

Trans Tech Publications
11 国際会議録 Charge Pumping Analysis of Monolithically Fabricated 4H-SiC CMOS Structures

L.C. Martin, D. Clark, E.P. Ramsay, A.E. Murphy, R.F. Thompson

Trans Tech Publications
6 国際会議録 High Temperature Silicon Carbide CMOS Integrated Circuits

D.T. Clark, E.P. Ramsay, A.E. Murphy, D.A. Smith, R.F. Thompson

Trans Tech Publications
12 国際会議録 Comparison of Oxide Quality for Monolithically Fabricated SiC CMOS Structures

L.C. Martin, D. Clark, E.P. Ramsay, A.E. Murphy, R.F. Thompson

Trans Tech Publications
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12