Increased Test Through Put on Dynamometers Through a System Approach to Noise and Vibration Testing

Increased Test Through Put on Dynamometers Through a System Approach to Noise and Vibration Testing

著者名:

掲載資料名:

Proceedings of the 13th International Modal Analysis Conference : February 13-16, 1995, Sheraton Misic City Hotel, Nashville, Tennessee

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2460

発行年:

1995

パート:

1

開始ページ:

941

終了ページ:

947

総ページ数:

7

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780912053486 [0912053488]

言語:

英語

請求記号:

P63600/2460

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057662
シリーズID:	PA00000029
会議名:	International Modal Analysis Conference
回次:	13th
会議開催地:	Nashville, TN, USA
会議開催年:	1995.02.13-1995.02.16
論文注記:	13th International Modal Analysis Conference, February 13-16, 1995, Nashville, TN, USA

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