Laser beam induced current (LBIC) spatial imaging as a characterization tool for infrared HgCdTe materials and devices

Laser beam induced current (LBIC) spatial imaging as a characterization tool for infrared HgCdTe materials and devices

著者名:

掲載資料名:

Infrared technology XXI : 9-13 July 1995, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2552

発行年:

1995

パート:

1

開始ページ:

134

終了ページ:

145

総ページ数:

12

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819419118 [0819419117]

言語:

英語

請求記号:

P63600/2552

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057753
シリーズID:	PA00000029
会議名:	Symposium on infrared technology
回次:	21st
会議開催地:	San Diego, CA, USA
会議開催年:	1995.07.09-1995.07.13
論文注記:	21st Symposium on infrared technology, July 9-13, 1995, San Diego, CA, USA. 2552-13

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