Tau decay analysis with neural networks

Tau decay analysis with neural networks

著者名:

掲載資料名:

Applications and science of artifical neural networks : 17-21 April 1995, Orlando, Florida

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2492

発行年:

1995

パート:

2

開始ページ:

1098

終了ページ:

1108

総ページ数:

11

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819418456 [0819418455]

言語:

英語

請求記号:

P63600/2492

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057694
シリーズID:	PA00000029
会議名:	Symposium on applications and science of artifical neural networks
回次:	1995
会議開催地:	Orlando, FL, USA
会議開催年:	1995.04.17-1995.04.21
論文注記:	1995 Symposium on applications and science of artifical neural networks, April 17-21, 1995, Orlando, FL, USA. 2492-114

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