Blank Cover Image

Homojunction interfacial workfunction internal photoemission (HIWIP) infrared detectors

著者名:
A.G.U. Perera  
掲載資料名:
Growth and characterization of materials for infrared detectors II : 13-14 July, 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2554
発行年:
1995
開始ページ:
143
終了ページ:
158
総ページ数:
16
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819419132 [0819419133]
言語:
英語
請求記号:
P63600/2554
資料種別:
国際会議録

類似資料:

A.G.U. Perera, H. Yuan, J.-W. Choe, M.H. Francombe

Society of Photo-optical Instrumentation Engineers

Perera, A. G. U., Yuan, H.X., Francombe, M.H.

Electrochemical Society

Yuan,H.X., Perera,A.G.U., Francombe,M.H., Gamage,S.K., Liu,H., Buchanan,M., Schaff,W.J.

SPIE-The International Society for Optical Engineering

Perea,A.G.U., Shen,W.Z., Liu,H.C., Buchanan,M., Schaff,W.J.

SPIE-The International Society for Optical Engineering

Perera,A.G.U., Shen,W.Z., Liu,H.C., Buchanan,M., Tanner,M.O., wang,K.L.

SPIE-The International Society for Optical Engineering

Perera, A.G.U.

SPIE-The International Society for Optical Engineering

Shen,W.Z., Perera,A.G.U.

SPIE-The International Society for Optical Engineering

Perare, A.G.U., Shen, W.Z., Liu, H.C., Buchanan, M., Schaff, W.J.

Electrochemical Society

Perera,A.G.U., Matsik,S.G., Letov,V.Y., Liu,H.C., Shen,A., Gao,M., Wasilewski,Z.R., Buchanan,M., Rolfe,S.J.

SPIE-The International Society for Optical Engineering

A. G. U. Perera

Society of Photo-optical Instrumentation Engineers

Perera,A.G.U., Shen,W.Z., Francombe,M.H., Shure,M.A., Liu,H.C., Buchanan,M., Schaff,W.J.

SPIE-The International Society for Optical Engineering

Perera, A.G.U., Matsik, S.G., Francombe, M.H.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12