Escape probability for negative electron affinity photocathodes: calculations compared to experiments
- 著者名:
- 掲載資料名:
- Photodetectors and power meters II : 11-12 July, 1995, San Diego, California
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2550
- 発行年:
- 1995
- 開始ページ:
- 142
- 終了ページ:
- 156
- 総ページ数:
- 15
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819419095 [0819419095]
- 言語:
- 英語
- 請求記号:
- P63600/2550
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
Electrochemical Society |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
Plenum Press |
4
国際会議録
Spectral response and surface layer thickness of GaAs:Cs-O negative electron affinity photocathode
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
D. Reidel |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |