Multiple particle technique for determination of differential scattering cross section of very small surface bound particles

Multiple particle technique for determination of differential scattering cross section of very small surface bound particles

著者名:

掲載資料名:

Optical scattering in the optics, semiconductor, and computer disk industries : 13-14 July 1995, San Diego, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2541

発行年:

1995

開始ページ:

108

終了ページ:

112

総ページ数:

5

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819419002 [0819419001]

言語:

英語

請求記号:

P63600/2541

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057742
シリーズID:	PA00000029
会議名:	Symposium on optical scattering in the optics, semiconductor, and computer disk industries
回次:	1995
会議開催地:	San Diego, CA, USA
会議開催年:	1995.07.13-1995.07.14
論文注記:	1995 Symposium on optical scattering in the optics, semiconductor, and computer disk industries, July 13-14, 1995, San Diego, CA, USA. 2541-12

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