Blank Cover Image

Tunnel near-field optical microscopy (TNOM-2)

著者名:
掲載資料名:
Near-field optics : 9-10 July, 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2535
発行年:
1995
開始ページ:
61
終了ページ:
68
総ページ数:
8
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418944 [0819418943]
言語:
英語
請求記号:
P63600/2535
資料種別:
国際会議録

類似資料:

1 国際会議録 "Tunnel" Near-Field Optical Microscopy: TNOM-2

Hecht B., Pohl W. D., Heinzelmann H ., Novony L.

Kluwer Academic Publishers
7 国際会議録 PROCESS DEPENDENT MORPHOLOGY OF THE Si/Si02 INTERFACE MEASURED WITH SCANNING TUNNELING MICROSCOPY

Hecht, Michael H., Bell, L. D., Grunthaner, F. J., Kaiser, W. J.

Materials Research Society
2 国際会議録 Local Exitation of Surface Plasmons by TNOM

Hecht B., Pohl W. D., Novotny L.

Kluwer Academic Publishers
8 国際会議録 Scanning Near-Field Optical Microscopes for High Resolution Imaging

Lacoste, Huser, Heinzelmann H., Guntherodt -J. H.

Kluwer Academic Publishers
3 国際会議録 Quo Vadis, Near Field Optics?

Pohl W. D., Hecht B., Heinzelmann H.

Kluwer Academic Publishers
9 国際会議録 Characterization of Materials and Devices by Near-Field Scanning Optical Microscopy

Goldberg, B. B., Ghaemi, H. F., Unlu, M. S., Herzog, W. D.

MRS - Materials Research Society
4 国際会議録 Light Propagation in Scanning Near-Field Optical Microscopy

Novotny L., Pohl W. D.

Kluwer Academic Publishers
10 国際会議録 "The 90｡?Prism as a Model SNOB Probe: Near-Field, Photon Tunneling, and Far-Field Properties"

Dereux A., Pohl D.

Kluwer Academic Publishers
5 国際会議録 "Optical Tunneling through and Adjustable Liquid Metal Cap"

Pohl W. D., Courjon D., Bainier C., Dereux A., Heinzelmann H.

Kluwer Academic Publishers
11 国際会議録 Characterization of VCSELs model output using near-field scanning optical microscopy

Bradford, W.C., Beach, J.D., Collins, R.T., Kisker, D.W., Galt, D.

SPIE-The International Society for Optical Engineering
6 国際会議録 The Tetrahedral Tip as a Probe for Scanning Near-Field Optical and for Scanning Tunneling Microscopy

Koglin J., Fischer C. U., Brzoska D. K., Gohde W., Fuchs H.

Kluwer Academic Publishers
12 国際会議録 Ultrafast laser nanofabrication assisted with near-field scanning optical microscopy

Wang, W., Hong, M.H., Wu, D., Goh, Y.W., Lin, Y., Luo, P., Luk'yanchuk, B.S., Lu, Y., Chong, T.C.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12