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Fluorescence scanning near-field optical microscopy in reflection

著者名:
掲載資料名:
Near-field optics : 9-10 July, 1995, San Diego, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2535
発行年:
1995
開始ページ:
38
終了ページ:
45
総ページ数:
8
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418944 [0819418943]
言語:
英語
請求記号:
P63600/2535
資料種別:
国際会議録

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