Blank Cover Image

Spectral characteristics of the Earth Observing System (EOS) Moderate-Resolution Imaging Spectroradiometer (MODIS)

著者名:
掲載資料名:
Imaging spectrometry : 17-18 April 1995, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2480
発行年:
1995
開始ページ:
142
終了ページ:
152
総ページ数:
11
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418333 [0819418331]
言語:
英語
請求記号:
P63600/2480
資料種別:
国際会議録

類似資料:

Pagano,T.S., Ballard,M., Forrest,A.L.De, Hudyma,R.M., Julian,R.L., Tessmer,A.L.

SPIE-The International Society for Optical Engineering

Barnes, W.L., Xiong, X., Guenther, B.W., Salomonson, V.

SPIE-The International Society for Optical Engineering

T.S. Pagano, J.B. Young, N.J. Therrien

Society of Photo-optical Instrumentation Engineers

Walker,J.A.,Jr., Pavlov,M.M., Byers,M.L.

SPIE - The International Society for Optical Engineering

Rojas,F., Schowengerdt,R.A., Biggar,S.F.

SPIE-The International Society for Optical Engineering

Dozier, J.

ESA Publications Division

T.S. Pagano

Society of Photo-optical Instrumentation Engineers

Butler,J.J., Johnson,B.C., Brown,S.W., Yoon,H.W., Barnes,R.A., Markham,B.L., Biggar,S.F., Zalewski,E.F., Spyak,P.R., …

SPIE - The International Society for Optical Engineering

*

National Aeronautics and Space Administration

Xiong, X., Che, N., Guenther, B., Barnes, W. L., Salomonson, V. V.

SPIE - The International Society of Optical Engineering

Bruegge,C.J., Chrien,N.C.L., Chafin,B.G., Diner,D.J., Ando,R.R.

SPIE-The International Society for Optical Engineering

Knight,E.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12