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Problems inherent to quantitative thermographic electrical inspections

著者名:
J.R. Snell, Jr.  
掲載資料名:
Thermosense XVII : International conference on thermal sensing and imaging diagnostic applications : 19-21 April 1995, Orlando, Florida
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2473
発行年:
1995
開始ページ:
75
終了ページ:
81
総ページ数:
7
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819418265 [0819418269]
言語:
英語
請求記号:
P63600/2473
資料種別:
国際会議録

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