Blank Cover Image

Absorption measurement of thin films by using photothermal techniques: the influence of thermal properties

著者名:
掲載資料名:
Laser-induced damage in optical materials, 1994 : 26th Annual Boulder Damage Symposium, proceedings, 24-26, October, 1994, Boulder, Colorado
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2428
発行年:
1995
開始ページ:
113
終了ページ:
113
総ページ数:
1
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819417763 [0819417769]
言語:
英語
請求記号:
P63600/2428
資料種別:
国際会議録

類似資料:

1 国際会議録 IN-SITU CHARACTERIZATION OF THIN POLYCRYSTALLINE DIAMOND FILM QUALITY BY THERMAL WAVE AND RAMAN TECHNIQUES

Pryor, R.W., Kuo, P.K., Wei, L., Thomas, R.L., Talley, P.L.

Materials Research Society
7 国際会議録 Thermal-wave imaging for NDE of composites and coatings

Favro,L.D., Kuo,P.K., Thomas,R.L.

SPIE-The International Society for Optical Engineering
2 国際会議録 Measuring corrosion thinning by thermal-wave imaging

Favro,L.D., Han,X., Ahmed,T., Kuo,P.K., Thomas,R.L.

SPIE-The International Society for Optical Engineering
8 国際会議録 Growth and characterization of laser-ablated boron nitride thin films

Z.L. Wu, R.W. Pryor, K.R. Padmanabhan, S. Villanueva, R.L. Thomas

Society of Photo-optical Instrumentation Engineers
3 国際会議録 Ultrasensitive detection of photothermal signal of thin films by using an optical amplification system

Gu,S.T., Wu,Z., Diehr,P., Lu,Y.S., Kuo,P.K.

SPIE-The International Society for Optical Engineering
9 国際会議録 Absorptance measurements of optical coatical coatings: a round robin

Chow,R., Taylor,J.R., Oplink,Z.Wu., Boccara,A.C., Broulik,U., Chen,Y., Commandre,M., Dijon,J., Fleig,C., Giesen,A., …

SPIE-The International Society for Optical Engineering
4 国際会議録 Overview of photothermal characterization of optical thin film coatings

Wu,Z., Thomsen,M., Kuo,P.K., Lu,Y.S., Stolz,C.J., Kozlowski,M.R.

SPIE-The International Society for Optical Engineering
10 国際会議録 Imaging the early time behavior of reflected thermal wave pulses

L.D. Favro, X. Han, P.-K. Kuo, R.L. Thomas

Society of Photo-optical Instrumentation Engineers
5 国際会議録 Measuring defect depths by thermal-wave imaging

Favro,L.D., Han,X., Kuo,P.K., Thomas,R.L.

SPIE-The International Society for Optical Engineering
11 国際会議録 Absolute absorption measurements in polymer films using photothermal deflection spectroscopy

Wu,L.-M., Knoesen,A.

SPIE - The International Society for Optical Engineering
6 国際会議録 Characterization of aluminum nitride thin films grown by plasma source molecular-beam epitaxy

G.W. Auner, P.K. Kuo, Y.S. Lu, Z.L. Wu

Society of Photo-optical Instrumentation Engineers
12 国際会議録 Laser-induced surface thermal lensing for thin film characterizations

Wu,Z., Kuo,P.K., Lu,Y.S., Gu,S.T.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12