Test chip fabrication of 3D optically coupled common memory for parallel processing system

Test chip fabrication of 3D optically coupled common memory for parallel processing system

著者名:

掲載資料名:

Optoelectronic interconnects III : 8-9 February 1995, San Jose, California

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

2400

発行年:

1995

開始ページ:

8

終了ページ:

15

総ページ数:

8

出版情報:

Bellingham, WA: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819417473 [0819417475]

言語:

英語

請求記号:

P63600/2400

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00057603
シリーズID:	PA00000029
会議名:	Symposium on optoelectronic interconnects
回次:	3rd
会議開催地:	San Jose, CA, USA
会議開催年:	1995.02.08-1995.02.09
論文注記:	3rd Symposium on optoelectronic interconnects, February 8-9, 1995, San Jose, CA, USA. 2400-02

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