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Evanescent photon capture by atomic force microscope (AFM) tips

著者名:
掲載資料名:
Scanning probe microscopies III : 6-7 February 1995, San Jose, California
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2384
発行年:
1995
開始ページ:
186
終了ページ:
190
総ページ数:
5
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819417312 [0819417319]
言語:
英語
請求記号:
P63600/2384
資料種別:
国際会議録

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