New surface minority carrier lifetime measurement technique
- 著者名:
- W. Goldfarb
- 掲載資料名:
- Optical characterization techniques for high-performance microelectronic device manufacturing : 20 October 1994, Austin, Texas
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2337
- 発行年:
- 1994
- 開始ページ:
- 129
- 終了ページ:
- 137
- 総ページ数:
- 9
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819416704 [0819416703]
- 言語:
- 英語
- 請求記号:
- P63600/2337
- 資料種別:
- 国際会議録
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6
国際会議録
Steady-state and Time-resolved Photoconductivity Measurements of Minority Carrier Lifetime in ZnTe
SPIE - The International Society for Optical Engineering |