CHARM-2: a new tool for characterization of wafer charging in ion- and plasma-based IC processing equipment
- 著者名:
- 掲載資料名:
- Manufacturing process control for microelectronic devices and circuits : 20-21 October 1994, Austin, Texas
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 2336
- 発行年:
- 1994
- 開始ページ:
- 208
- 終了ページ:
- 216
- 総ページ数:
- 9
- 出版情報:
- Bellingham, WA: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819416698 [081941669X]
- 言語:
- 英語
- 請求記号:
- P63600/2336
- 資料種別:
- 国際会議録
類似資料:
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
2
国際会議録
*CHARACTERIZATION AND CONTROL OF WAFER CHARGING EFFECTS DURING HIGH-CURRENT ION IMPLANTATION
Electrochemical Society |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
MRS - Materials Research Society |
10
国際会議録
Modeling, Simulation and Control of Single Wafer Process in Cluster Tool Base on FT-IR-Line Sensor
MRS - Materials Research Society |
Trans Tech Publications |
MRS - Materials Research Society |
Electrochemical Society |
Trans Tech Publications |