Micro-Displacement, Stain and Stress Measurement Based on Electronic Speckle Pattern Interferometry
- 著者名:
- 掲載資料名:
- Advances in materials manufacturing science and technology XV : selected, peer reviewed papers from the 15th International Manufacturing Conference in China (15th IMCC), October 16-18, 2013, Nanjing, China
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 770
- 発行年:
- 2014
- 開始ページ:
- 267
- 終了ページ:
- 271
- 総ページ数:
- 5
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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SPIE - The International Society of Optical Engineering |
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6
国際会議録
Electronic speckle pattern shearing interferometry for displacement and vibration measurement
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |